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Test generation for combinational circuits in Java Writer 3 of 9 in Java Test generation for combinational circuits




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Test generation for combinational circuits use spring framework code-39 drawer todraw ansi/aim code 39 in java Mobile Barcode Usage G1 x1 1 c3 G4 1 c6 G3 x3 x4 c1 x5 c2 G2 G6 c8 1 c 10 G7 1 c4. c5 c7 G5 c9 Figure 4.43 An example circuit C 16 . (This circuit is a modi ed version of a circuit in Roth (1966)).

4.24 4.25.

4.27 4.28 4.

29 4.30 4.31 4.

32. Comment on barcode code39 for Java the differences in the values assigned to lines. Using Variation 1 described in Section 4.5.

3.5, compute the testability measures for each line in the circuit in Figure 4.43.

Using Variation 2 described in Section 4.5.3.

5, compute the testability measures for each line in the circuit in Figure 4.9. Analyze the values of CC 0 (c) and CC 1 (c) at each line c and describe what parameter is captured by these values.

Generate a test for fault x5 SA0 in the circuit shown in Figure 4.43 using (a) the D-algorithm, (b) the six-valued system, and (c) the testability measures computed in Problem 4.24 and the rules presented in Section 4.

6.2.2.

Repeat Problem 4.26 using PODEM instead of the D-algorithm. Repeat Problem 4.

26 using more powerful techniques to identify TGSTs, including future unique D-drive. Use the six-valued system and the D-algorithm to generate a test for fault c9 SA0 in the circuit shown in Figure 4.42.

Repeat Problem 4.29 using PODEM. Compare the time complexities (in terms of number of backtracks) of the two algorithms for this case.

Use the 16-valued system and the D-algorithm to generate a test for fault c9 SA0 in the circuit shown in Figure 4.42. In the above problem, what is the value obtained at the circuit s primary output after implication is performed following fault effect excitation Are all lines justi ed at this stage Is the partial vector at this stage a test for the target fault If not, can it be modi ed in any simple manner to obtain a test Write a test generation procedure that generates test vectors for single SAFs in fanout-free circuits.

. Exercises w1 w2 w3 w4 w5 w6 w7 Figure 4.44 A combinational black-box z1 z2 z3 z4 z5 z6 C BB 4.34 A comp swing bar code 39 lete set of test vectors is given for the seven-input six-output combinational circuit block, CBB , shown in Figure 4.44.

However, the internal structure of this circuit is not known. This circuit is combined with the circuit shown in Figure 4.43 to obtain a new circuit.

In this new combinational circuit, output z of the circuit shown in Figure 4.43 drives input w1 of CBB . How can a complete test set be obtained for the new combinational circuit 4.

35 Two combinational blocks, C1 with n 1 inputs and one output and C2 with n 2 inputs and an arbitrary number of outputs, are given. A combinational circuit C with n 1 + n 2 1 inputs is obtained by connecting the output of C1 to one of the inputs of C2 . Given that the upper bound on the search required to generate a vector for an SAF in a general n-input combinational circuit is 2n , formulate a test generation strategy for circuit C for which the upper bound on the search required is 2n 1 + 2n 2 .

4.36 Write the CNF for the fault-free version of circuit in Figure 4.1(a).

Write the CNF for the version of the circuit with a SA1 fault at line c9 shown in Figure 4.1(b). Generate a test vector for the above fault.

4.37 Generate a test vector for the circuit and fault shown in Figure 4.1(b) using the BDD approach.

4.38 Consider the circuit shown in Figure 4.10 and a fault list comprised of each possible single SAF.

(a) Perform fault simulation for a set of vectors containing the following four randomly generated vectors: P1 = (1, 1, 0, 0), P2 = (0, 1, 1, 0), P3 = (0, 0, 1, 1), and P4 = (1, 1, 0, 1). Drop from the fault list all faults detected by the above set of vectors. (b) Generate a test vector for a fault that still remains undetected in the circuit.

If the vector is incompletely speci ed, randomly assign values to its unspeci ed bits. Perform fault simulation and drop from the fault list all faults detected by this vector. Add the vector to the set of vectors.

Repeat test.
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